suryanshyaknow / faulty-wafer-component-detection Goto Github PK
View Code? Open in Web Editor NEWdata fetched by wafers (thin slices of semiconductors) is to be passed through the machine learning pipeline and it is to be determined whether the wafer at hand is faulty or not. Wafers are predominantly used to manufacture solar cells and are located at remote locations in bulk and they themselves consist of few hundreds of sensors.
Home Page: http://ec2-3-111-196-105.ap-south-1.compute.amazonaws.com:8080/
License: MIT License